Logical Fault Modelling Algorithm for Stuck-at-Faul
K. Mariya Priyadarshini1, Kurra Harshitha2, Pritika Kanchan3, K. Mercy Romitha4
1Ms. K. Mariya Priyadarshini, Assistant Professor Electronics & Communication Engineering Guntur, India.
2Kurra Harshitha, Electronics & Communication Engineering KLEF Guntur, India.
3Pritika Kanchan, Electronics & Communication Engineering KLEF Guntur, India.
4K. Mercy Romitha, Electronics & Communication Engineering KLEF Guntur, India.
Manuscript received on January 01, 2021. | Revised Manuscript received on January 09, 2021. | Manuscript published on March 10, 2021. | PP: 20-23 | Volume-1 Issue-1, March 2021 | Retrieval Number: A1002031121/2021©LSP
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© The Authors. Published by Lattice Science Publication (LSP). This is an open access article under the CC-BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/)
Abstract: With miniaturization happening around with the technology, it’s very important that the faults associated with these circuits to get accurate results, especially electronics circuits. Besides, finding these faults is a tough job as there will be several test inputs that needs to be tested to check the circuit is fault free or not. Stuck at line is a deficiency prototype used as a part of computerized testing circuit. When any of the line in the circuit is stuck permanently at power supply or ground giving unwanted output, this is called fault. This paper describes about a technique that can be used to find stuck at fault and display the test vectors that generates the faulty output. Any self-assertive different shortcoming in combinational and consecutive circuits can be mimicked and tried utilizing the displayed stuck at fault model. High fault coverage is especially significant during assembling test, and strategies. Stuck at fault results are presented and detected. The outcomes of single stuck at faults are presented in this paper using Verilog code.
Keywords: Fault Detection, Test Pattern Generation, Stuck-at-fault, Single Stuck-at-fault, Fault Algorithm.